METROLOGÍA POR FUSIÓN DE DATOS MULTIESCALA PARA LA CARACTERIZACIÓN DE PIEZAS COMPLEJAS
Currently, there is a wide range of metrological equipment focused on both macro- and micro-geometric dimensional characterization. However, macro-systems face limitations when measuring components smaller than 1 mm or dealing with complex, non-prismatic geometries where traditional 3D systems cannot achieve the required measurement uncertainties. Conversely, micro-geometric systems are typically restricted by their small measurement range (often below 1 mm).
The primary objective of this project is to develop an integrated methodology for the macro- and micro-geometric characterization of components with critical geometries. This approach enables a comprehensive dimensional measurement by leveraging the group’s extensive expertise in Computed Tomography (CT), wide-range microscopy, and Additive Manufacturing (AM). A key component of this objective is the development of a robust and suitable uncertainty budget and calculation methodology.